Electronic component testing / (Record no. 57583)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00945nam a2200301 i 4500 |
| 001 - CONTROL NUMBER | |
| control field | 4584254 |
| 003 - CONTROL NUMBER IDENTIFIER | |
| control field | PK-NaQUE |
| 005 - DATE AND TIME OF LATEST TRANSACTION | |
| control field | 20170523073207.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 760515s1972 enka b 000 0 eng |
| 010 ## - LIBRARY OF CONGRESS CONTROL NUMBER | |
| LC control number | 75306992 |
| 015 ## - NATIONAL BIBLIOGRAPHY NUMBER | |
| National bibliography number | GB72-24797 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 0333137914 : |
| Terms of availability | £0.95 |
| 040 ## - CATALOGING SOURCE | |
| Original cataloging agency | DLC |
| Transcribing agency | DLC |
| Modifying agency | DLC |
| 050 00 - LIBRARY OF CONGRESS CALL NUMBER | |
| Classification number | TK7870 |
| Item number | .E443 1972 |
| 082 00 - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 621.3815/1 |
| 245 00 - TITLE STATEMENT | |
| Title | Electronic component testing / |
| Statement of responsibility, etc | edited by W. F. Waller. |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
| Place of publication, distribution, etc | London : |
| Name of publisher, distributor, etc | Macmillan, |
| Date of publication, distribution, etc | 1972. |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | [4], 91 p. : |
| Other physical details | ill. ; |
| Dimensions | 30 cm. |
| 490 0# - SERIES STATEMENT | |
| Series statement | Electronic engineering series |
| 490 0# - SERIES STATEMENT | |
| Series statement | Macmillan engineering evaluations : student editions |
| 504 ## - BIBLIOGRAPHY, ETC. NOTE | |
| Bibliography, etc | Includes bibliographies. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name as entry element | Electronic apparatus and appliances |
| General subdivision | Testing. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name as entry element | Semiconductors |
| General subdivision | Testing. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name as entry element | Integrated circuits |
| General subdivision | Testing. |
| 700 1# - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Waller, William F. |
| 906 ## - LOCAL DATA ELEMENT F, LDF (RLIN) | |
| a | 7 |
| b | cbc |
| c | orignew |
| d | u |
| e | ncip |
| f | 19 |
| g | y-gencatlg |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Source of classification or shelving scheme | Dewey Decimal Classification |
| Koha item type | Books |
| Withdrawn status | Lost status | Source of classification or shelving scheme | Damaged status | Not for loan | Home library | Current library | Date acquired | Total Checkouts | Full call number | Barcode | Date last seen | Price effective from | Koha item type |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Dewey Decimal Classification | Central Library, QUEST, Nawabshah | Central Library, QUEST, Nawabshah | 23/05/2017 | 621.3815/1 | 4549 | 23/05/2017 | 23/05/2017 | Books |