| 000 | 00813nam a2200277 a 4500 | ||
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| 999 |
_c717 _d717 |
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| 003 | PK-NaQUE | ||
| 005 | 20250625111733.0 | ||
| 008 | 250625b ||||| |||| 00| 0 eng d | ||
| 020 | _a8172248911 (paperback) | ||
| 020 | _a9788172248918 (paperback) | ||
| 040 | _cQUEST | ||
| 082 |
_a621.3815 _bABR |
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| 100 | 1 | _aAbramovici, Miron. | |
| 245 | 1 | 0 | _aDigital Systems Testing and Testable Design / |
| 250 | _aRevised. | ||
| 260 |
_a[S.l.] : _bJaico Publishing House, _c2007. |
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| 300 | _a670 p. ; | ||
| 650 | _aDigital integrated circuits | ||
| 650 | _aDesign and construction | ||
| 650 | _aDigital integrated circuits | ||
| 650 | _aTesting | ||
| 700 | 1 | _aBreuer, Melvin A. | |
| 700 | 1 | _aFriedman, Arthur D. | |
| 856 | 4 | 0 |
_uhttp://10.10.170.122:8080/browse/book/23632 _yDownload eBook |
| 942 |
_cBK _2ddc |
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