| 000 | 00945nam a2200301 i 4500 | ||
|---|---|---|---|
| 001 | 4584254 | ||
| 003 | PK-NaQUE | ||
| 005 | 20170523073207.0 | ||
| 008 | 760515s1972 enka b 000 0 eng | ||
| 010 | _a 75306992 | ||
| 015 | _aGB72-24797 | ||
| 020 |
_a0333137914 : _c£0.95 |
||
| 040 |
_aDLC _cDLC _dDLC |
||
| 050 | 0 | 0 |
_aTK7870 _b.E443 1972 |
| 082 | 0 | 0 | _a621.3815/1 |
| 245 | 0 | 0 |
_aElectronic component testing / _cedited by W. F. Waller. |
| 260 |
_aLondon : _bMacmillan, _c1972. |
||
| 300 |
_a[4], 91 p. : _bill. ; _c30 cm. |
||
| 490 | 0 | _aElectronic engineering series | |
| 490 | 0 | _aMacmillan engineering evaluations : student editions | |
| 504 | _aIncludes bibliographies. | ||
| 650 | 0 |
_aElectronic apparatus and appliances _xTesting. |
|
| 650 | 0 |
_aSemiconductors _xTesting. |
|
| 650 | 0 |
_aIntegrated circuits _xTesting. |
|
| 700 | 1 | _aWaller, William F. | |
| 906 |
_a7 _bcbc _corignew _du _encip _f19 _gy-gencatlg |
||
| 942 |
_2ddc _cBK |
||
| 999 |
_c57583 _d57580 |
||