TY  - BOOK
AU  - Brandon, David
AU  - Kaplanm Wayne D. 
TI  - Microstructural Characterization of Materials 
SN  - 0470027851
U1  - 620.11299BRA 
PY  - 2008///
PB  - Wiley
KW  - Materials--Microscopy
KW  - Microstructure
UR  - http://10.10.170.122:8080/browse/book/29660
ER  -