00945nam a2200301 i 4500 4584254 PK-NaQUE 20170523073207.0 760515s1972 enka b 000 0 eng 75306992 GB72-24797 0333137914 : £0.95 DLC DLC DLC TK7870 .E443 1972 621.3815/1 Electronic component testing / edited by W. F. Waller. London : Macmillan, 1972. [4], 91 p. : ill. ; 30 cm. Electronic engineering series Macmillan engineering evaluations : student editions Includes bibliographies. Electronic apparatus and appliances Testing. Semiconductors Testing. Integrated circuits Testing. Waller, William F. 7 cbc orignew u ncip 19 y-gencatlg ddc BK 57583 57580 0 0 ddc 0 0 QUESTCL QUESTCL 2017-05-23 0 621.3815/1 4549 2017-05-23 00:00:00 2017-05-23 BK